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    Pulsed measurements and circuit modeling of weak and strong avalanche effects in GaAs MESFETs and HEMTs. द्वारा Meneghesso, G.

    में प्रकाशित IEEE Transactions on electron devices
    लेख

    Pulsed measurements and circuit modeling of weak and strong avalanche effects in GaAs MESFETs and HEMTs.

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