Đang hiển thị 1 - 10 kết quả của 23 cho tìm kiếm '"Integrated circuit testing."', thời gian truy vấn: 0.02s Tinh chỉnh kết quả
  1. 1

    Design for testability, debug and reliability next generation measures using formal techniques Bằng Huhn, Sebastian, Drechsler, Rolf

    Được phát hành 2021
    lấy văn bản
    lấy văn bản
    Electronic Resource

    Design for testability, debug and reliability next generation measures using formal techniques
  2. 2

    Counterfeit integrated circuits detection and avoidance Bằng Tehranipoor, Mohammad H. 1974-, Guin, Ujjwal, Forte, Domenic

    Được phát hành 2015
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Counterfeit integrated circuits detection and avoidance
  3. 3

    Digital system test and testable design using HDL models and architectures Bằng Navabi, Zainalabedin

    Được phát hành 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Digital system test and testable design using HDL models and architectures
  4. 4

    Accelerating test, validation and debug of high speed serial interfaces Bằng Fan, Yongquan 1970-

    Được phát hành 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Accelerating test, validation and debug of high speed serial interfaces
  5. 5

    Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach

    Được phát hành 2008
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach
  6. 6

    RF measurements for cellular phones and wireless data systems Bằng Scott, Allan W.

    Được phát hành 2008
    Sách

    RF measurements for cellular phones and wireless data systems
  7. 7

    Digital integrated circuits design-for-test using Simulink and Stateflow Bằng Perelroyzen, Evgeni

    Được phát hành 2007
    Sách

    Digital integrated circuits design-for-test using Simulink and Stateflow
  8. 8

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits Bằng Bushnell, Michael L. (Michael Lee) 1950-, Agrawal, Vishwani D. 1943-

    Được phát hành 2000
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  9. 9

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits Bằng Bushnell, Michael L. (Michael Lee) 1950-

    Được phát hành 2000
    Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access
    Sách

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  10. 10

    Analog and mixed signal test

    Được phát hành 1998
    Sách

    Analog and mixed signal test

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