Gösterilen 1 - 8 sonuçlar arası kayıtlar. 8 sonuç. Aranan kelime '"Integrated circuits Very large scale integration Testing."', Sorgu süresi: 0.02s Sonuçları Daraltın
  1. 1

    Debug automation from pre-silicon to post-silicon Yazar: Dehbashi, Mehdi, Fey, Gorschwin

    Baskı/Yayın Bilgisi 2015
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Debug automation from pre-silicon to post-silicon
  2. 2

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits Yazar: Bushnell, Michael L. 1950-, Agrawal, Vishwani D. 1943-

    Baskı/Yayın Bilgisi 2000
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  3. 3

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits Yazar: Bushnell, Michael L. 1950-

    Baskı/Yayın Bilgisi 2000
    Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access
    Kitap

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  4. 4

    VLSI testing digital and mixed analogue/digital techniques Yazar: Hurst, Stanley L.

    Baskı/Yayın Bilgisi 1998
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    VLSI testing digital and mixed analogue/digital techniques
  5. 5

    VLSI testing digital and mixed analogue/digital techniques Yazar: Hurst, Stanley L.

    Baskı/Yayın Bilgisi 1998
    Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access
    Kitap

    VLSI testing digital and mixed analogue/digital techniques
  6. 6

    Algorithmic and knowledge based CAD for VLSI

    Baskı/Yayın Bilgisi 1992
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    Algorithmic and knowledge based CAD for VLSI
  7. 7

    Diagnostic measurements in LSI/VLSI integrated circuits production Yazar: Jakubowski, Andrzej

    Baskı/Yayın Bilgisi 1991
    Kitap

    Diagnostic measurements in LSI/VLSI integrated circuits production
  8. 8

    Introduction to VLSI testing Yazar: Feugate, Robert J. 1946-

    Baskı/Yayın Bilgisi 1988
    Kitap

    Introduction to VLSI testing

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