Отображение 1 - 10 результаты of 12 для поиска '"VLSI circuits."', время запроса: 0.02сек. Отмена результатов
  1. 1

    The design of DNA self-assembled computing circuitry. по Dwyer, C.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    The design of DNA self-assembled computing circuitry.
  2. 2

    Toward the accurate prediction of placement wire length distributions in VLSI circuits. по Dambre, J.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Toward the accurate prediction of placement wire length distributions in VLSI circuits.
  3. 3

    Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects. по Seongkyun Shin

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects.
  4. 4

    Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits. по Maheshwari, A.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits.
  5. 5

    Design of wireless on-wafer submicron characterization system. по Moore, B.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Design of wireless on-wafer submicron characterization system.
  6. 6

    Efficient algorithms for multilevel power estimation of VLSI circuits. по Bachmann, W.W

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Efficient algorithms for multilevel power estimation of VLSI circuits.
  7. 7

    Cascaded Bayesian inferencing for switching activity estimation with correlated inputs. по Bhanja, S.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Cascaded Bayesian inferencing for switching activity estimation with correlated inputs.
  8. 8

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. по Pomeranz, I.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations.
  9. 9

    Design of hierarchical cellular automata for on-chip test pattern generator. по Sikdar, B.K

    Статья

    Design of hierarchical cellular automata for on-chip test pattern generator.
  10. 10

    Statistical analysis of subthreshold leakage current for VLSI circuits. по Rao, R.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Statistical analysis of subthreshold leakage current for VLSI circuits.

Инструменты поиска: