Отображение 1 - 4 результаты of 4 для поиска '"Test sequences."', время запроса: 0.02сек. Отмена результатов
  1. 1

    Reverse-order-restoration-based static test compaction for synchronous sequential circuits. по Ruifeng Guo

    Статья

    Reverse-order-restoration-based static test compaction for synchronous sequential circuits.
  2. 2

    Incremental integration testing of concurrent programs. по Koppol, P.V

    Опубликовано в: IEEE Transactions on software engineering
    Статья

    Incremental integration testing of concurrent programs.
  3. 3

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. по Pomeranz, I.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations.
  4. 4

    Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations. по Qikai Chen

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations.

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