Отображение 1 - 6 результаты of 6 для поиска '"Test data compression."', время запроса: 0.02сек. Отмена результатов
  1. 1

    A unified approach to reduce SOC test data volume, scan power and testing time. по Chandra, A.

    Статья

    A unified approach to reduce SOC test data volume, scan power and testing time.
  2. 2

    Synchronization overhead in SOC compressed test. по Gonciari, P.T

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Synchronization overhead in SOC compressed test.
  3. 3

    Weighted pseudorandom hybrid BIST. по Jas, A.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Weighted pseudorandom hybrid BIST.
  4. 4

    Test slice difference technique for low-transition test data compression. по Rau, Jiann-Chyi

    Опубликовано в: Journal of Applied Science and Engineering
    Статья

    Test slice difference technique for low-transition test data compression.
  5. 5

    Nine-coded compression technique for testing embedded cores in SoCs. по Tehranipoor, M.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Nine-coded compression technique for testing embedded cores in SoCs.
  6. 6

    Test data compression technique for embedded cores using virtual scan chains. по Jas, A.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Test data compression technique for embedded cores using virtual scan chains.

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