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Profile monitoring with binary data and random predictors.
Опубликовано в: Journal of Quality TechnologyСтатья -
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A review and perspective on control charting with image data.
Опубликовано в: Journal of Quality TechnologyСтатья -
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Individual T2 control chart for compositional data.
Опубликовано в: Journal of Quality TechnologyСтатья -
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Data mining of printed-circuit board defects.
Опубликовано в: IEEE Transactions on robotics and automationСтатья