Отображение 1 - 5 результаты of 5 для поиска '"Integrated circuits Reliability."', время запроса: 0.01сек. Отмена результатов
  1. 1

    Design for testability, debug and reliability next generation measures using formal techniques по Huhn, Sebastian, Drechsler, Rolf

    Опубликовано 2021
    Полный текст
    Полный текст
    Electronic Resource

    Design for testability, debug and reliability next generation measures using formal techniques
  2. 2

    Circuit design for reliability

    Опубликовано 2015
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Circuit design for reliability
  3. 3

    Integrated circuit quality and reliability по Hnatek, Eugene R.

    Опубликовано 1995
    ‌

    Integrated circuit quality and reliability
  4. 4

    Robust circuit and system design methodologies for nanometer-scale devices and single-electron transistors. по Schmid, A.

    Опубликовано в: IEEE Transactions on VLSI systems
    Статья

    Robust circuit and system design methodologies for nanometer-scale devices and single-electron transistors.
  5. 5

    Nondestructive and subsurface defect detection in integrated circuits using advanced microscopy and spectroscopy techniques по Tarun, Alvarado B.

    Диссертация

    Nondestructive and subsurface defect detection in integrated circuits using advanced microscopy and spectroscopy techniques

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