Отображение 1 - 5 результаты of 5 для поиска '"Fixed pattern noise."', время запроса: 0.01сек. Отмена результатов
  1. 1

    New signal readout method for ultrahigh-sensitivity CMOS image sensor. по Watabe, T.

    Опубликовано в: IEEE Transactions on electron devices
    Статья

    New signal readout method for ultrahigh-sensitivity CMOS image sensor.
  2. 2

    Dark current reduction in stacked-type CMOS-APS for charged particle imaging. по Takayanagi, I.

    Опубликовано в: IEEE Transactions on electron devices
    Статья

    Dark current reduction in stacked-type CMOS-APS for charged particle imaging.
  3. 3

    Total dose and displacement damage effects in a radiation-hardened CMOS APS. по Bogaerts, J.

    Опубликовано в: IEEE Transactions on electron devices
    Статья

    Total dose and displacement damage effects in a radiation-hardened CMOS APS.
  4. 4

    Transversal-readout architecture for CMOS active pixel image sensors. по Miyatake, S.

    Опубликовано в: IEEE Transactions on electron devices
    Статья

    Transversal-readout architecture for CMOS active pixel image sensors.
  5. 5

    Modeling of the bulk versus SOI CMOS performances for the optimal design of APS circuits in low-power low-voltage applications. по Afzalian, A.

    Опубликовано в: IEEE Transactions on electron devices
    Статья

    Modeling of the bulk versus SOI CMOS performances for the optimal design of APS circuits in low-power low-voltage applications.

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