Toon 1 - 6 resultaten van 6 Voor zoekopdracht '"Test data compression."', zoektijd: 0,01s Verfijn jouw resultaten
  1. 1

    A unified approach to reduce SOC test data volume, scan power and testing time. door Chandra, A.

    Artikel

    A unified approach to reduce SOC test data volume, scan power and testing time.
  2. 2

    Synchronization overhead in SOC compressed test. door Gonciari, P.T

    Artikel

    Synchronization overhead in SOC compressed test.
  3. 3

    Weighted pseudorandom hybrid BIST. door Jas, A.

    Artikel

    Weighted pseudorandom hybrid BIST.
  4. 4

    Test slice difference technique for low-transition test data compression. door Rau, Jiann-Chyi

    Artikel

    Test slice difference technique for low-transition test data compression.
  5. 5

    Nine-coded compression technique for testing embedded cores in SoCs. door Tehranipoor, M.

    Artikel

    Nine-coded compression technique for testing embedded cores in SoCs.
  6. 6

    Test data compression technique for embedded cores using virtual scan chains. door Jas, A.

    Artikel

    Test data compression technique for embedded cores using virtual scan chains.

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