Toon 1 - 8 resultaten van 8 Voor zoekopdracht '"Integrated circuits Very large scale integration Testing."', zoektijd: 0,02s Verfijn jouw resultaten
  1. 1

    Debug automation from pre-silicon to post-silicon door Dehbashi, Mehdi, Fey, Gorschwin

    Gepubliceerd in 2015
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Debug automation from pre-silicon to post-silicon
  2. 2

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits door Bushnell, Michael L. 1950-, Agrawal, Vishwani D. 1943-

    Gepubliceerd in 2000
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  3. 3

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits door Bushnell, Michael L. 1950-

    Gepubliceerd in 2000
    Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access
    Boek

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  4. 4

    VLSI testing digital and mixed analogue/digital techniques door Hurst, Stanley L.

    Gepubliceerd in 1998
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    VLSI testing digital and mixed analogue/digital techniques
  5. 5

    VLSI testing digital and mixed analogue/digital techniques door Hurst, Stanley L.

    Gepubliceerd in 1998
    Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access
    Boek

    VLSI testing digital and mixed analogue/digital techniques
  6. 6

    Algorithmic and knowledge based CAD for VLSI

    Gepubliceerd in 1992
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    Algorithmic and knowledge based CAD for VLSI
  7. 7

    Diagnostic measurements in LSI/VLSI integrated circuits production door Jakubowski, Andrzej

    Gepubliceerd in 1991
    Boek

    Diagnostic measurements in LSI/VLSI integrated circuits production
  8. 8

    Introduction to VLSI testing door Feugate, Robert J. 1946-

    Gepubliceerd in 1988
    Boek

    Introduction to VLSI testing

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