Toon 1 - 10 resultaten van 23 Voor zoekopdracht '"Integrated circuit testing."', zoektijd: 0,02s Verfijn jouw resultaten
  1. 1

    Design for testability, debug and reliability next generation measures using formal techniques door Huhn, Sebastian, Drechsler, Rolf

    Gepubliceerd in 2021
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    Electronic Resource

    Design for testability, debug and reliability next generation measures using formal techniques
  2. 2

    Counterfeit integrated circuits detection and avoidance door Tehranipoor, Mohammad H. 1974-, Guin, Ujjwal, Forte, Domenic

    Gepubliceerd in 2015
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Counterfeit integrated circuits detection and avoidance
  3. 3

    Digital system test and testable design using HDL models and architectures door Navabi, Zainalabedin

    Gepubliceerd in 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Digital system test and testable design using HDL models and architectures
  4. 4

    Accelerating test, validation and debug of high speed serial interfaces door Fan, Yongquan 1970-

    Gepubliceerd in 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Accelerating test, validation and debug of high speed serial interfaces
  5. 5

    Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach

    Gepubliceerd in 2008
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach
  6. 6

    RF measurements for cellular phones and wireless data systems door Scott, Allan W.

    Gepubliceerd in 2008
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    RF measurements for cellular phones and wireless data systems
  7. 7

    Digital integrated circuits design-for-test using Simulink and Stateflow door Perelroyzen, Evgeni

    Gepubliceerd in 2007
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    Digital integrated circuits design-for-test using Simulink and Stateflow
  8. 8

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits door Bushnell, Michael L. (Michael Lee) 1950-, Agrawal, Vishwani D. 1943-

    Gepubliceerd in 2000
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  9. 9

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits door Bushnell, Michael L. (Michael Lee) 1950-

    Gepubliceerd in 2000
    Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access
    Boek

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  10. 10

    Analog and mixed signal test

    Gepubliceerd in 1998
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    Analog and mixed signal test

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