検索結果 1 - 5 結果 / 5 検索語 '"Integrated circuits Reliability."', 処理時間: 0.01秒 結果の絞り込み
  1. 1

    Design for testability, debug and reliability next generation measures using formal techniques 著者: Huhn, Sebastian, Drechsler, Rolf

    出版事項 2021
    全文の入手
    全文の入手
    Electronic Resource

    Design for testability, debug and reliability next generation measures using formal techniques
  2. 2

    Circuit design for reliability

    出版事項 2015
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Circuit design for reliability
  3. 3

    Integrated circuit quality and reliability 著者: Hnatek, Eugene R.

    出版事項 1995
    図書

    Integrated circuit quality and reliability
  4. 4

    Robust circuit and system design methodologies for nanometer-scale devices and single-electron transistors. 著者: Schmid, A.

    論文

    Robust circuit and system design methodologies for nanometer-scale devices and single-electron transistors.
  5. 5

    Nondestructive and subsurface defect detection in integrated circuits using advanced microscopy and spectroscopy techniques 著者: Tarun, Alvarado B.

    学位論文

    Nondestructive and subsurface defect detection in integrated circuits using advanced microscopy and spectroscopy techniques

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