検索結果 1 - 10 結果 / 23 検索語 '"Integrated circuit testing."', 処理時間: 0.02秒 結果の絞り込み
  1. 1

    Design for testability, debug and reliability next generation measures using formal techniques 著者: Huhn, Sebastian, Drechsler, Rolf

    出版事項 2021
    全文の入手
    全文の入手
    Electronic Resource

    Design for testability, debug and reliability next generation measures using formal techniques
  2. 2

    Counterfeit integrated circuits detection and avoidance 著者: Tehranipoor, Mohammad H. 1974-, Guin, Ujjwal, Forte, Domenic

    出版事項 2015
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Counterfeit integrated circuits detection and avoidance
  3. 3

    Digital system test and testable design using HDL models and architectures 著者: Navabi, Zainalabedin

    出版事項 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Digital system test and testable design using HDL models and architectures
  4. 4

    Accelerating test, validation and debug of high speed serial interfaces 著者: Fan, Yongquan 1970-

    出版事項 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Accelerating test, validation and debug of high speed serial interfaces
  5. 5

    Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach

    出版事項 2008
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach
  6. 6

    RF measurements for cellular phones and wireless data systems 著者: Scott, Allan W.

    出版事項 2008
    図書

    RF measurements for cellular phones and wireless data systems
  7. 7

    Digital integrated circuits design-for-test using Simulink and Stateflow 著者: Perelroyzen, Evgeni

    出版事項 2007
    図書

    Digital integrated circuits design-for-test using Simulink and Stateflow
  8. 8

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits 著者: Bushnell, Michael L. (Michael Lee) 1950-, Agrawal, Vishwani D. 1943-

    出版事項 2000
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  9. 9

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits 著者: Bushnell, Michael L. (Michael Lee) 1950-

    出版事項 2000
    Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access
    図書

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  10. 10

    Analog and mixed signal test

    出版事項 1998
    図書

    Analog and mixed signal test

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