Showing 1 - 6 results of 6 for search '"Test data compression."', सवाल का समय: 0.01सेकंड परिणाम को परिष्कृत करें
  1. 1

    A unified approach to reduce SOC test data volume, scan power and testing time. द्वारा Chandra, A.

    लेख

    A unified approach to reduce SOC test data volume, scan power and testing time.
  2. 2

    Synchronization overhead in SOC compressed test. द्वारा Gonciari, P.T

    में प्रकाशित IEEE Transactions on VLSI systems
    लेख

    Synchronization overhead in SOC compressed test.
  3. 3

    Weighted pseudorandom hybrid BIST. द्वारा Jas, A.

    में प्रकाशित IEEE Transactions on VLSI systems
    लेख

    Weighted pseudorandom hybrid BIST.
  4. 4

    Test slice difference technique for low-transition test data compression. द्वारा Rau, Jiann-Chyi

    में प्रकाशित Journal of Applied Science and Engineering
    लेख

    Test slice difference technique for low-transition test data compression.
  5. 5

    Nine-coded compression technique for testing embedded cores in SoCs. द्वारा Tehranipoor, M.

    में प्रकाशित IEEE Transactions on VLSI systems
    लेख

    Nine-coded compression technique for testing embedded cores in SoCs.
  6. 6

    Test data compression technique for embedded cores using virtual scan chains. द्वारा Jas, A.

    में प्रकाशित IEEE Transactions on VLSI systems
    लेख

    Test data compression technique for embedded cores using virtual scan chains.

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