Showing 1 - 8 results of 8 for search '"Integrated circuits Very large scale integration Testing."', सवाल का समय: 0.02सेकंड परिणाम को परिष्कृत करें
  1. 1

    Debug automation from pre-silicon to post-silicon द्वारा Dehbashi, Mehdi, Fey, Gorschwin

    प्रकाशित 2015
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Debug automation from pre-silicon to post-silicon
  2. 2

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits द्वारा Bushnell, Michael L. 1950-, Agrawal, Vishwani D. 1943-

    प्रकाशित 2000
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  3. 3

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits द्वारा Bushnell, Michael L. 1950-

    प्रकाशित 2000
    Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access
    पुस्तक

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  4. 4

    VLSI testing digital and mixed analogue/digital techniques द्वारा Hurst, Stanley L.

    प्रकाशित 1998
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    VLSI testing digital and mixed analogue/digital techniques
  5. 5

    VLSI testing digital and mixed analogue/digital techniques द्वारा Hurst, Stanley L.

    प्रकाशित 1998
    Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access
    पुस्तक

    VLSI testing digital and mixed analogue/digital techniques
  6. 6

    Algorithmic and knowledge based CAD for VLSI

    प्रकाशित 1992
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    Algorithmic and knowledge based CAD for VLSI
  7. 7

    Diagnostic measurements in LSI/VLSI integrated circuits production द्वारा Jakubowski, Andrzej

    प्रकाशित 1991
    पुस्तक

    Diagnostic measurements in LSI/VLSI integrated circuits production
  8. 8

    Introduction to VLSI testing द्वारा Feugate, Robert J. 1946-

    प्रकाशित 1988
    पुस्तक

    Introduction to VLSI testing

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