Showing 1 - 4 results of 4 for search '"Test sequences."', זמן שאילתה: 0.02s Refine Results
  1. 1

    Reverse-order-restoration-based static test compaction for synchronous sequential circuits. מאת Ruifeng Guo

    Article

    Reverse-order-restoration-based static test compaction for synchronous sequential circuits.
  2. 2

    Incremental integration testing of concurrent programs. מאת Koppol, P.V

    Article

    Incremental integration testing of concurrent programs.
  3. 3

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. מאת Pomeranz, I.

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations.
  4. 4

    Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations. מאת Qikai Chen

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations.

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