Showing 1 - 2 results of 2 for search '"Test generation procedure."', זמן שאילתה: 0.13s Refine Results
  1. 1

    Test enrichment for path delay faults using multiple sets of target faults. מאת Pomeranz, I.

    Article

    Test enrichment for path delay faults using multiple sets of target faults.
  2. 2

    Autoscan a scan design without external scan inputs or outputs. מאת Pomeranz, I.

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Autoscan a scan design without external scan inputs or outputs.

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