Showing 1 - 6 results of 6 for search '"Test data compression."', זמן שאילתה: 0.01s Refine Results
  1. 1

    A unified approach to reduce SOC test data volume, scan power and testing time. מאת Chandra, A.

    Article

    A unified approach to reduce SOC test data volume, scan power and testing time.
  2. 2

    Synchronization overhead in SOC compressed test. מאת Gonciari, P.T

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Synchronization overhead in SOC compressed test.
  3. 3

    Weighted pseudorandom hybrid BIST. מאת Jas, A.

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Weighted pseudorandom hybrid BIST.
  4. 4

    Test slice difference technique for low-transition test data compression. מאת Rau, Jiann-Chyi

    Article

    Test slice difference technique for low-transition test data compression.
  5. 5

    Nine-coded compression technique for testing embedded cores in SoCs. מאת Tehranipoor, M.

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Nine-coded compression technique for testing embedded cores in SoCs.
  6. 6

    Test data compression technique for embedded cores using virtual scan chains. מאת Jas, A.

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Test data compression technique for embedded cores using virtual scan chains.

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