Showing 1 - 3 results of 3 for search '"Test cost reduction."', זמן שאילתה: 0.02s Refine Results
  1. 1

    SOC test planning using virtual test access architectures. מאת Sehgal, A.

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    SOC test planning using virtual test access architectures.
  2. 2

    Weighted pseudorandom hybrid BIST. מאת Jas, A.

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Weighted pseudorandom hybrid BIST.
  3. 3

    Low-power scan design using first-level supply gating. מאת Bhunia, S.

    הוצא לאור ב IEEE Transactions on VLSI systems
    Article

    Low-power scan design using first-level supply gating.

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