Showing 1 - 8 results of 8 for search '"Integrated circuits Very large scale integration Testing."', זמן שאילתה: 0.02s Refine Results
  1. 1

    Debug automation from pre-silicon to post-silicon מאת Dehbashi, Mehdi, Fey, Gorschwin

    יצא לאור 2015
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Debug automation from pre-silicon to post-silicon
  2. 2

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits מאת Bushnell, Michael L. 1950-, Agrawal, Vishwani D. 1943-

    יצא לאור 2000
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  3. 3

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits מאת Bushnell, Michael L. 1950-

    יצא לאור 2000
    Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access
    ספר

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  4. 4

    VLSI testing digital and mixed analogue/digital techniques מאת Hurst, Stanley L.

    יצא לאור 1998
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    VLSI testing digital and mixed analogue/digital techniques
  5. 5

    VLSI testing digital and mixed analogue/digital techniques מאת Hurst, Stanley L.

    יצא לאור 1998
    Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access
    ספר

    VLSI testing digital and mixed analogue/digital techniques
  6. 6

    Algorithmic and knowledge based CAD for VLSI

    יצא לאור 1992
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    Algorithmic and knowledge based CAD for VLSI
  7. 7

    Diagnostic measurements in LSI/VLSI integrated circuits production מאת Jakubowski, Andrzej

    יצא לאור 1991
    ספר

    Diagnostic measurements in LSI/VLSI integrated circuits production
  8. 8

    Introduction to VLSI testing מאת Feugate, Robert J. 1946-

    יצא לאור 1988
    ספר

    Introduction to VLSI testing

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