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  1. 1

    Test enrichment for path delay faults using multiple sets of target faults. por Pomeranz, I.

    Artigo

    Test enrichment for path delay faults using multiple sets of target faults.
  2. 2

    Autoscan a scan design without external scan inputs or outputs. por Pomeranz, I.

    Artigo

    Autoscan a scan design without external scan inputs or outputs.

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