Design for testability, debug and reliability next generation measures using formal techniques por Huhn, Sebastian, Drechsler, Rolf

Ligazón do recurso
Ligazón do recurso

Counterfeit integrated circuits detection and avoidance por Tehranipoor, Mohammad H. 1974-, Guin, Ujjwal, Forte, Domenic

Available for University of the Philippines System via SpringerLink. Click here to access
Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy

Digital system test and testable design using HDL models and architectures por Navabi, Zainalabedin

Available for University of the Philippines Diliman via SpringerLink. Click here to access

Accelerating test, validation and debug of high speed serial interfaces por Fan, Yongquan 1970-

Available for University of the Philippines Diliman via SpringerLink. Click here to access

Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach

Available for University of the Philippines Diliman via IET Digital Library. Click here to access
Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy

RF measurements for cellular phones and wireless data systems por Scott, Allan W.

Digital integrated circuits design-for-test using Simulink and Stateflow por Perelroyzen, Evgeni

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits por Bushnell, Michael L. (Michael Lee) 1950-, Agrawal, Vishwani D. 1943-

Available for University of the Philippines System via SpringerLink. Click here to access
Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits por Bushnell, Michael L. (Michael Lee) 1950-

Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access

Analog and mixed signal test