Showing 1 - 3 results of 3 for search '"External testing."', tempo de consulta: 0.02s Limitar resultados
  1. 1

    Testing the monster chip. por Zorian, Y.

    Publicado en IEEE spectrum
    Artigo

    Testing the monster chip.
  2. 2

    Weighted pseudorandom hybrid BIST. por Jas, A.

    Artigo

    Weighted pseudorandom hybrid BIST.
  3. 3

    Test data compression technique for embedded cores using virtual scan chains. por Jas, A.

    Artigo

    Test data compression technique for embedded cores using virtual scan chains.

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