1 - 8 toradh á dtaispeáint as 8 toradh san iomlán ar an gcuardach '"Integrated circuits Very large scale integration Testing."', am iarratais: 0.02s Beachtaigh na torthaí
  1. 1

    Debug automation from pre-silicon to post-silicon de réir Dehbashi, Mehdi, Fey, Gorschwin

    Foilsithe / Cruthaithe 2015
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Debug automation from pre-silicon to post-silicon
  2. 2

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits de réir Bushnell, Michael L. 1950-, Agrawal, Vishwani D. 1943-

    Foilsithe / Cruthaithe 2000
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  3. 3

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits de réir Bushnell, Michael L. 1950-

    Foilsithe / Cruthaithe 2000
    Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access
    LEABHAR

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  4. 4

    VLSI testing digital and mixed analogue/digital techniques de réir Hurst, Stanley L.

    Foilsithe / Cruthaithe 1998
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    VLSI testing digital and mixed analogue/digital techniques
  5. 5

    VLSI testing digital and mixed analogue/digital techniques de réir Hurst, Stanley L.

    Foilsithe / Cruthaithe 1998
    Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access
    LEABHAR

    VLSI testing digital and mixed analogue/digital techniques
  6. 6

    Algorithmic and knowledge based CAD for VLSI

    Foilsithe / Cruthaithe 1992
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    Algorithmic and knowledge based CAD for VLSI
  7. 7

    Diagnostic measurements in LSI/VLSI integrated circuits production de réir Jakubowski, Andrzej

    Foilsithe / Cruthaithe 1991
    LEABHAR

    Diagnostic measurements in LSI/VLSI integrated circuits production
  8. 8

    Introduction to VLSI testing de réir Feugate, Robert J. 1946-

    Foilsithe / Cruthaithe 1988
    LEABHAR

    Introduction to VLSI testing

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