1 - 10 toradh á dtaispeáint as 23 toradh san iomlán ar an gcuardach '"Integrated circuit testing."', am iarratais: 0.03s Beachtaigh na torthaí
  1. 1

    Design for testability, debug and reliability next generation measures using formal techniques de réir Huhn, Sebastian, Drechsler, Rolf

    Foilsithe / Cruthaithe 2021
    Faigh an téacs iomlán
    Faigh an téacs iomlán
    Electronic Resource

    Design for testability, debug and reliability next generation measures using formal techniques
  2. 2

    Counterfeit integrated circuits detection and avoidance de réir Tehranipoor, Mohammad H. 1974-, Guin, Ujjwal, Forte, Domenic

    Foilsithe / Cruthaithe 2015
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Counterfeit integrated circuits detection and avoidance
  3. 3

    Digital system test and testable design using HDL models and architectures de réir Navabi, Zainalabedin

    Foilsithe / Cruthaithe 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Digital system test and testable design using HDL models and architectures
  4. 4

    Accelerating test, validation and debug of high speed serial interfaces de réir Fan, Yongquan 1970-

    Foilsithe / Cruthaithe 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Accelerating test, validation and debug of high speed serial interfaces
  5. 5

    Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach

    Foilsithe / Cruthaithe 2008
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach
  6. 6

    RF measurements for cellular phones and wireless data systems de réir Scott, Allan W.

    Foilsithe / Cruthaithe 2008
    LEABHAR

    RF measurements for cellular phones and wireless data systems
  7. 7

    Digital integrated circuits design-for-test using Simulink and Stateflow de réir Perelroyzen, Evgeni

    Foilsithe / Cruthaithe 2007
    LEABHAR

    Digital integrated circuits design-for-test using Simulink and Stateflow
  8. 8

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits de réir Bushnell, Michael L. (Michael Lee) 1950-, Agrawal, Vishwani D. 1943-

    Foilsithe / Cruthaithe 2000
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  9. 9

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits de réir Bushnell, Michael L. (Michael Lee) 1950-

    Foilsithe / Cruthaithe 2000
    Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access
    LEABHAR

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  10. 10

    Analog and mixed signal test

    Foilsithe / Cruthaithe 1998
    LEABHAR

    Analog and mixed signal test

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