1 - 2 toradh á dtaispeáint as 2 toradh san iomlán ar an gcuardach '"Design for testability technique."', am iarratais: 0.02s Beachtaigh na torthaí
  1. 1

    Testing ASICs with multiple identical cores. de réir Yuejian Wu

    Alt

    Testing ASICs with multiple identical cores.
  2. 2

    Autoscan a scan design without external scan inputs or outputs. de réir Pomeranz, I.

    Alt

    Autoscan a scan design without external scan inputs or outputs.

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