Näytetään 1 - 6 yhteensä 6 tuloksesta haulle '"Test data compression."', hakuaika: 0,01s Tarkenna hakua
  1. 1

    A unified approach to reduce SOC test data volume, scan power and testing time. Tekijä Chandra, A.

    Artikkeli

    A unified approach to reduce SOC test data volume, scan power and testing time.
  2. 2

    Synchronization overhead in SOC compressed test. Tekijä Gonciari, P.T

    Artikkeli

    Synchronization overhead in SOC compressed test.
  3. 3

    Weighted pseudorandom hybrid BIST. Tekijä Jas, A.

    Artikkeli

    Weighted pseudorandom hybrid BIST.
  4. 4

    Test slice difference technique for low-transition test data compression. Tekijä Rau, Jiann-Chyi

    Artikkeli

    Test slice difference technique for low-transition test data compression.
  5. 5

    Nine-coded compression technique for testing embedded cores in SoCs. Tekijä Tehranipoor, M.

    Artikkeli

    Nine-coded compression technique for testing embedded cores in SoCs.
  6. 6

    Test data compression technique for embedded cores using virtual scan chains. Tekijä Jas, A.

    Artikkeli

    Test data compression technique for embedded cores using virtual scan chains.

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