Erakusten 1 - 10 emaitzak -- 77 bilaketa honetara 'IEEE Transactions on computer-aided design of integrated circuits and systems', Bilaketaren denbora: 0,02s Findu emaitzak
  1. 1

    IEEE transactions on computer-aided design of integrated circuits and systems.

    Argitaratua 2001
    Liburua

    IEEE transactions on computer-aided design of integrated circuits and systems.
  2. 2

    IEEE Transactions on computer-aided design of integrated circuits and systems.

    Continuing Resource

    IEEE Transactions on computer-aided design of integrated circuits and systems.
  3. 3

    Efficient very large scale integration power nork Tan, S.X.-D

    Artikulua

    Efficient very large scale integration power
  4. 4

    Simulation of arsenic in situ doping with polysilicon CVD and its application to high aspect ratio trenches. nork Heitzinger, C.

    Artikulua

    Simulation of arsenic in situ doping with polysilicon CVD and its application to high aspect ratio trenches.
  5. 5

    Reverse-order-restoration-based static test compaction for synchronous sequential circuits. nork Ruifeng Guo

    Artikulua

    Reverse-order-restoration-based static test compaction for synchronous sequential circuits.
  6. 6

    Exact path delay fault coverage with fundamental ZBDD operations. nork Padmanaban, S.

    Artikulua

    Exact path delay fault coverage with fundamental ZBDD operations.
  7. 7

    A unified approach to reduce SOC test data volume, scan power and testing time. nork Chandra, A.

    Artikulua

    A unified approach to reduce SOC test data volume, scan power and testing time.
  8. 8

    Test pattern generation and clock disabling for simultaneous test time and power reduction. nork Jih-Jeen Chen

    Artikulua

    Test pattern generation and clock disabling for simultaneous test time and power reduction.
  9. 9

    Power supply transient signal analysis for defect-oriented test. nork Plusquellic, J.

    Artikulua

    Power supply transient signal analysis for defect-oriented test.
  10. 10

    Partial BIST insertion to eliminate data correlation. nork Qiushuang Zhang

    Artikulua

    Partial BIST insertion to eliminate data correlation.

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