Erakusten 1 - 6 emaitzak -- 6 bilaketa honetara '"Test data compression."', Bilaketaren denbora: 0,01s Findu emaitzak
  1. 1

    A unified approach to reduce SOC test data volume, scan power and testing time. nork Chandra, A.

    Artikulua

    A unified approach to reduce SOC test data volume, scan power and testing time.
  2. 2

    Synchronization overhead in SOC compressed test. nork Gonciari, P.T

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    Synchronization overhead in SOC compressed test.
  3. 3

    Weighted pseudorandom hybrid BIST. nork Jas, A.

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    Weighted pseudorandom hybrid BIST.
  4. 4

    Test slice difference technique for low-transition test data compression. nork Rau, Jiann-Chyi

    Artikulua

    Test slice difference technique for low-transition test data compression.
  5. 5

    Nine-coded compression technique for testing embedded cores in SoCs. nork Tehranipoor, M.

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    Nine-coded compression technique for testing embedded cores in SoCs.
  6. 6

    Test data compression technique for embedded cores using virtual scan chains. nork Jas, A.

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    Test data compression technique for embedded cores using virtual scan chains.

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