Erakusten 1 - 8 emaitzak -- 8 bilaketa honetara '"Integrated circuits Very large scale integration Testing."', Bilaketaren denbora: 0,02s Findu emaitzak
  1. 1

    Debug automation from pre-silicon to post-silicon nork Dehbashi, Mehdi, Fey, Gorschwin

    Argitaratua 2015
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Debug automation from pre-silicon to post-silicon
  2. 2

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits nork Bushnell, Michael L. 1950-, Agrawal, Vishwani D. 1943-

    Argitaratua 2000
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  3. 3

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits nork Bushnell, Michael L. 1950-

    Argitaratua 2000
    Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access
    Liburua

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  4. 4

    VLSI testing digital and mixed analogue/digital techniques nork Hurst, Stanley L.

    Argitaratua 1998
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    VLSI testing digital and mixed analogue/digital techniques
  5. 5

    VLSI testing digital and mixed analogue/digital techniques nork Hurst, Stanley L.

    Argitaratua 1998
    Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access
    Liburua

    VLSI testing digital and mixed analogue/digital techniques
  6. 6

    Algorithmic and knowledge based CAD for VLSI

    Argitaratua 1992
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    Algorithmic and knowledge based CAD for VLSI
  7. 7

    Diagnostic measurements in LSI/VLSI integrated circuits production nork Jakubowski, Andrzej

    Argitaratua 1991
    Liburua

    Diagnostic measurements in LSI/VLSI integrated circuits production
  8. 8

    Introduction to VLSI testing nork Feugate, Robert J. 1946-

    Argitaratua 1988
    Liburua

    Introduction to VLSI testing

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