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1
Indium phosphide ICs unleash the high-frequency spectrum.
Argitaratua izan da IEEE spectrumArtikulua -
2
Impact ionization measurements and modeling for power PHEMT.
Argitaratua izan da IEEE Transactions on electron devicesArtikulua -
3
Impact ionization measurements and modeling for power PHEMT.
Argitaratua izan da IEEE Transactions on electron devicesArtikulua