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1
New signal readout method for ultrahigh-sensitivity CMOS image sensor.
Argitaratua izan da IEEE Transactions on electron devicesArtikulua -
2
Dark current reduction in stacked-type CMOS-APS for charged particle imaging.
Argitaratua izan da IEEE Transactions on electron devicesArtikulua -
3
Total dose and displacement damage effects in a radiation-hardened CMOS APS.
Argitaratua izan da IEEE Transactions on electron devicesArtikulua -
4
Transversal-readout architecture for CMOS active pixel image sensors.
Argitaratua izan da IEEE Transactions on electron devicesArtikulua -
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