Erakusten 1 - 2 emaitzak -- 2 bilaketa honetara '"Design for testability technique."', Bilaketaren denbora: 0,02s Findu emaitzak
  1. 1

    Testing ASICs with multiple identical cores. nork Yuejian Wu

    Artikulua

    Testing ASICs with multiple identical cores.
  2. 2

    Autoscan a scan design without external scan inputs or outputs. nork Pomeranz, I.

    Argitaratua izan da IEEE Transactions on VLSI systems
    Artikulua

    Autoscan a scan design without external scan inputs or outputs.

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