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Design for testability, debug and reliability next generation measures using formal techniques
Published 2021Get full text
Get full text
Electronic Resource -
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Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach
Published 2008Available for University of the Philippines Diliman via IET Digital Library. Click here to access
Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
Electronic Resource -
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Published 2000Available for University of the Philippines System via SpringerLink. Click here to access
Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
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