Εμφανίζονται 1 - 10 Αποτελέσματα από 125 για την αναζήτηση 'IEEE Transactions on power electronics', χρόνος αναζήτησης: 0,02δλ Περιορισμός αποτελεσμάτων
  1. 1

    Transactions on high-performance embedded architectures and compilers IV

    Έκδοση 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Transactions on high-performance embedded architectures and compilers IV
  2. 2

    IEEE transactions on power delivery.

    Έκδοση 2000
    Βιβλίο

    IEEE transactions on power delivery.
  3. 3

    IEEE transactions on power electronics.

    Έκδοση 2000
    Βιβλίο

    IEEE transactions on power electronics.
  4. 4

    IEEE transactions on power systems.

    Έκδοση 2000
    Βιβλίο

    IEEE transactions on power systems.
  5. 5

    IEEE Transactions on power electronics.

    Έκδοση 1986
    Available for University of the Philippines Diliman via IEEE Xplore Digital Library . Click here to access
    Continuing Resource

    IEEE Transactions on power electronics.
  6. 6

    Experimental investigations of the effect of the mode-hopping on the noise properties of InGaAsP Fabry-Perot multiple-quantum-well laser diodes. ανά Palenskis, V.

    Τόπος έκδοσης IEEE Transactions on electron devices
    Άρθρο

    Experimental investigations of the effect of the mode-hopping on the noise properties of InGaAsP Fabry-Perot multiple-quantum-well laser diodes.
  7. 7

    Development of high-current 4H-SiC ACCUFET. ανά Singh, R.

    Τόπος έκδοσης IEEE Transactions on electron devices
    Άρθρο

    Development of high-current 4H-SiC ACCUFET.
  8. 8

    Impact ionization measurements and modeling for power PHEMT. ανά Baksht, T.

    Τόπος έκδοσης IEEE Transactions on electron devices
    Άρθρο

    Impact ionization measurements and modeling for power PHEMT.
  9. 9

    On the destruction limit of Si power diodes during reverse recovery with dynamic avalanche. ανά Domeij, M.

    Τόπος έκδοσης IEEE Transactions on electron devices
    Άρθρο

    On the destruction limit of Si power diodes during reverse recovery with dynamic avalanche.
  10. 10

    An analysis of small-signal gate-drain resistance effect on RF power MOSFETs. ανά Yo-Sheng Lin

    Τόπος έκδοσης IEEE Transactions on electron devices
    Άρθρο

    An analysis of small-signal gate-drain resistance effect on RF power MOSFETs.

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