Εμφανίζονται 1 - 10 Αποτελέσματα από 12 για την αναζήτηση '"VLSI circuits."', χρόνος αναζήτησης: 0,02δλ Περιορισμός αποτελεσμάτων
  1. 1

    The design of DNA self-assembled computing circuitry. ανά Dwyer, C.

    Τόπος έκδοσης IEEE Transactions on VLSI systems
    Άρθρο

    The design of DNA self-assembled computing circuitry.
  2. 2

    Toward the accurate prediction of placement wire length distributions in VLSI circuits. ανά Dambre, J.

    Τόπος έκδοσης IEEE Transactions on VLSI systems
    Άρθρο

    Toward the accurate prediction of placement wire length distributions in VLSI circuits.
  3. 3

    Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects. ανά Seongkyun Shin

    Τόπος έκδοσης IEEE Transactions on VLSI systems
    Άρθρο

    Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects.
  4. 4

    Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits. ανά Maheshwari, A.

    Τόπος έκδοσης IEEE Transactions on VLSI systems
    Άρθρο

    Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits.
  5. 5

    Design of wireless on-wafer submicron characterization system. ανά Moore, B.

    Τόπος έκδοσης IEEE Transactions on VLSI systems
    Άρθρο

    Design of wireless on-wafer submicron characterization system.
  6. 6

    Efficient algorithms for multilevel power estimation of VLSI circuits. ανά Bachmann, W.W

    Τόπος έκδοσης IEEE Transactions on VLSI systems
    Άρθρο

    Efficient algorithms for multilevel power estimation of VLSI circuits.
  7. 7

    Cascaded Bayesian inferencing for switching activity estimation with correlated inputs. ανά Bhanja, S.

    Τόπος έκδοσης IEEE Transactions on VLSI systems
    Άρθρο

    Cascaded Bayesian inferencing for switching activity estimation with correlated inputs.
  8. 8

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. ανά Pomeranz, I.

    Τόπος έκδοσης IEEE Transactions on VLSI systems
    Άρθρο

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations.
  9. 9

    Design of hierarchical cellular automata for on-chip test pattern generator. ανά Sikdar, B.K

    Άρθρο

    Design of hierarchical cellular automata for on-chip test pattern generator.
  10. 10

    Statistical analysis of subthreshold leakage current for VLSI circuits. ανά Rao, R.

    Τόπος έκδοσης IEEE Transactions on VLSI systems
    Άρθρο

    Statistical analysis of subthreshold leakage current for VLSI circuits.

Εργαλεία αναζήτησης: