Εμφανίζονται 1 - 4 Αποτελέσματα από 4 για την αναζήτηση '"Test sequences."', χρόνος αναζήτησης: 0,02δλ Περιορισμός αποτελεσμάτων
  1. 1

    Reverse-order-restoration-based static test compaction for synchronous sequential circuits. ανά Ruifeng Guo

    Άρθρο

    Reverse-order-restoration-based static test compaction for synchronous sequential circuits.
  2. 2

    Incremental integration testing of concurrent programs. ανά Koppol, P.V

    Τόπος έκδοσης IEEE Transactions on software engineering
    Άρθρο

    Incremental integration testing of concurrent programs.
  3. 3

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. ανά Pomeranz, I.

    Τόπος έκδοσης IEEE Transactions on VLSI systems
    Άρθρο

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations.
  4. 4

    Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations. ανά Qikai Chen

    Τόπος έκδοσης IEEE Transactions on VLSI systems
    Άρθρο

    Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations.

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