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Reverse-order-restoration-based static test compaction for synchronous sequential circuits.
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Ruifeng Guo
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IEEE Transactions on computer-aided design of integrated circuits and systems
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Incremental integration testing of concurrent programs.
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Koppol, P.V
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IEEE Transactions on software engineering
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Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations.
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Pomeranz, I.
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IEEE Transactions on VLSI systems
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Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variations.
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Qikai Chen
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DATABASE
Union Catalog (Buklod)
4 results
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AUTHOR
Koppol, P.V
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Pomeranz, I.
1 results
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Qikai Chen
1 results
1
Ruifeng Guo
1 results
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Article
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English
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