Debug automation from pre-silicon to post-silicon gan Dehbashi, Mehdi, Fey, Gorschwin

Available for University of the Philippines System via SpringerLink. Click here to access
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits gan Bushnell, Michael L. 1950-, Agrawal, Vishwani D. 1943-

Available for University of the Philippines System via SpringerLink. Click here to access
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits gan Bushnell, Michael L. 1950-

Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access

VLSI testing digital and mixed analogue/digital techniques gan Hurst, Stanley L.

Available for University of the Philippines Diliman via IET Digital Library. Click here to access
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VLSI testing digital and mixed analogue/digital techniques gan Hurst, Stanley L.

Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access

Algorithmic and knowledge based CAD for VLSI

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Diagnostic measurements in LSI/VLSI integrated circuits production gan Jakubowski, Andrzej

Introduction to VLSI testing gan Feugate, Robert J. 1946-