Dangos 1 - 3 canlyniadau o 3 ar gyfer chwilio '"External testing."', amser ymholiad: 0.02e Mireinio'r Canlyniadau
  1. 1

    Testing the monster chip. gan Zorian, Y.

    Cyhoeddwyd yn IEEE spectrum
    Erthygl

    Testing the monster chip.
  2. 2

    Weighted pseudorandom hybrid BIST. gan Jas, A.

    Erthygl

    Weighted pseudorandom hybrid BIST.
  3. 3

    Test data compression technique for embedded cores using virtual scan chains. gan Jas, A.

    Erthygl

    Test data compression technique for embedded cores using virtual scan chains.

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