Mostrar 1 - 10 resultats de 23 per cerca '"Integrated circuit testing."', hora de la petició: 0.02sec Refinar resultats
  1. 1

    Design for testability, debug and reliability next generation measures using formal techniques per Huhn, Sebastian, Drechsler, Rolf

    Publicat 2021
    Obtenir text complet
    Obtenir text complet
    Electronic Resource

    Design for testability, debug and reliability next generation measures using formal techniques
  2. 2

    Counterfeit integrated circuits detection and avoidance per Tehranipoor, Mohammad H. 1974-, Guin, Ujjwal, Forte, Domenic

    Publicat 2015
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Counterfeit integrated circuits detection and avoidance
  3. 3

    Digital system test and testable design using HDL models and architectures per Navabi, Zainalabedin

    Publicat 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Digital system test and testable design using HDL models and architectures
  4. 4

    Accelerating test, validation and debug of high speed serial interfaces per Fan, Yongquan 1970-

    Publicat 2011
    Available for University of the Philippines Diliman via SpringerLink. Click here to access
    Electronic Resource

    Accelerating test, validation and debug of high speed serial interfaces
  5. 5

    Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach

    Publicat 2008
    Available for University of the Philippines Diliman via IET Digital Library. Click here to access
    Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
    Electronic Resource

    Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach
  6. 6

    RF measurements for cellular phones and wireless data systems per Scott, Allan W.

    Publicat 2008
    Llibre

    RF measurements for cellular phones and wireless data systems
  7. 7

    Digital integrated circuits design-for-test using Simulink and Stateflow per Perelroyzen, Evgeni

    Publicat 2007
    Llibre

    Digital integrated circuits design-for-test using Simulink and Stateflow
  8. 8

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits per Bushnell, Michael L. (Michael Lee) 1950-, Agrawal, Vishwani D. 1943-

    Publicat 2000
    Available for University of the Philippines System via SpringerLink. Click here to access
    Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy
    Electronic Resource

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  9. 9

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits per Bushnell, Michael L. (Michael Lee) 1950-

    Publicat 2000
    Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access
    Llibre

    Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
  10. 10

    Analog and mixed signal test

    Publicat 1998
    Llibre

    Analog and mixed signal test

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