Mostrar 1 - 3 resultats de 3 per cerca '"External testing."', hora de la petició: 0.02sec Refinar resultats
  1. 1

    Testing the monster chip. per Zorian, Y.

    Publicat a IEEE spectrum
    Article

    Testing the monster chip.
  2. 2

    Weighted pseudorandom hybrid BIST. per Jas, A.

    Article

    Weighted pseudorandom hybrid BIST.
  3. 3

    Test data compression technique for embedded cores using virtual scan chains. per Jas, A.

    Article

    Test data compression technique for embedded cores using virtual scan chains.

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