يعرض 1 - 10 نتائج من 12 نتيجة بحث عن '"VLSI circuits."', وقت الاستعلام: 0.02s تنقيح النتائج
  1. 1

    The design of DNA self-assembled computing circuitry. حسب Dwyer, C.

    الحاوية / القاعدة IEEE Transactions on VLSI systems
    مقال

    The design of DNA self-assembled computing circuitry.
  2. 2

    Toward the accurate prediction of placement wire length distributions in VLSI circuits. حسب Dambre, J.

    الحاوية / القاعدة IEEE Transactions on VLSI systems
    مقال

    Toward the accurate prediction of placement wire length distributions in VLSI circuits.
  3. 3

    Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects. حسب Seongkyun Shin

    الحاوية / القاعدة IEEE Transactions on VLSI systems
    مقال

    Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects.
  4. 4

    Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits. حسب Maheshwari, A.

    الحاوية / القاعدة IEEE Transactions on VLSI systems
    مقال

    Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits.
  5. 5

    Design of wireless on-wafer submicron characterization system. حسب Moore, B.

    الحاوية / القاعدة IEEE Transactions on VLSI systems
    مقال

    Design of wireless on-wafer submicron characterization system.
  6. 6

    Efficient algorithms for multilevel power estimation of VLSI circuits. حسب Bachmann, W.W

    الحاوية / القاعدة IEEE Transactions on VLSI systems
    مقال

    Efficient algorithms for multilevel power estimation of VLSI circuits.
  7. 7

    Cascaded Bayesian inferencing for switching activity estimation with correlated inputs. حسب Bhanja, S.

    الحاوية / القاعدة IEEE Transactions on VLSI systems
    مقال

    Cascaded Bayesian inferencing for switching activity estimation with correlated inputs.
  8. 8

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. حسب Pomeranz, I.

    الحاوية / القاعدة IEEE Transactions on VLSI systems
    مقال

    Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations.
  9. 9

    Design of hierarchical cellular automata for on-chip test pattern generator. حسب Sikdar, B.K

    مقال

    Design of hierarchical cellular automata for on-chip test pattern generator.
  10. 10

    Statistical analysis of subthreshold leakage current for VLSI circuits. حسب Rao, R.

    الحاوية / القاعدة IEEE Transactions on VLSI systems
    مقال

    Statistical analysis of subthreshold leakage current for VLSI circuits.

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