Debug automation from pre-silicon to post-silicon حسب Dehbashi, Mehdi, Fey, Gorschwin

Available for University of the Philippines System via SpringerLink. Click here to access
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits حسب Bushnell, Michael L. 1950-, Agrawal, Vishwani D. 1943-

Available for University of the Philippines System via SpringerLink. Click here to access
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits حسب Bushnell, Michael L. 1950-

Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access

VLSI testing digital and mixed analogue/digital techniques حسب Hurst, Stanley L.

Available for University of the Philippines Diliman via IET Digital Library. Click here to access
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VLSI testing digital and mixed analogue/digital techniques حسب Hurst, Stanley L.

Also available online for University of the Philippines Diliman via IET Digital Library. Click here to access

Algorithmic and knowledge based CAD for VLSI

Available for University of the Philippines Diliman via IET Digital Library. Click here to access
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Diagnostic measurements in LSI/VLSI integrated circuits production حسب Jakubowski, Andrzej

Introduction to VLSI testing حسب Feugate, Robert J. 1946-