Design for testability, debug and reliability next generation measures using formal techniques حسب Huhn, Sebastian, Drechsler, Rolf

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Counterfeit integrated circuits detection and avoidance حسب Tehranipoor, Mohammad H. 1974-, Guin, Ujjwal, Forte, Domenic

Available for University of the Philippines System via SpringerLink. Click here to access
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Digital system test and testable design using HDL models and architectures حسب Navabi, Zainalabedin

Available for University of the Philippines Diliman via SpringerLink. Click here to access

Accelerating test, validation and debug of high speed serial interfaces حسب Fan, Yongquan 1970-

Available for University of the Philippines Diliman via SpringerLink. Click here to access

Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach

Available for University of the Philippines Diliman via IET Digital Library. Click here to access
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RF measurements for cellular phones and wireless data systems حسب Scott, Allan W.

Digital integrated circuits design-for-test using Simulink and Stateflow حسب Perelroyzen, Evgeni

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits حسب Bushnell, Michael L. 1950-, Agrawal, Vishwani D. 1943-

Available for University of the Philippines System via SpringerLink. Click here to access
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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits حسب Bushnell, Michael L. 1950-

Also available online for University of the Philippines Diliman College of Engineering via Springer. Click here to access

Analog and mixed signal test