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Characterisation and control of defects in semiconductors
Được phát hành 2019Available for University of the Philippines Diliman via IET Digital Library. Click here to access
Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy
Electronic Resource -
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Characterization of silicon p-n junctions fabricated by ion shower doping
Được phát hành 2004Luận văn -
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Arsenic flux dependence of the mobility and junction electric field of modulation-doped GaAs/AlGaAs heterostructures
Được phát hành 2002Luận văn -
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Mathematical modeling of implant dose and characterization of P-N junctions formed by ion shower technology (IST)
Được phát hành 2000Luận văn -
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