Machine vision automated visual inspection : theory, practice and applications по Beyerer, Jurgen, Puente Leon, Fernando 1969-, Frese, Christian

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Optical inspection of sub-surface defects using digital shearography and statistical fringe analysis по Catalan, Francesca Celine I.

Optical characterization of semiconductors infrared, raman, and photoluminescence spectroscopy по Perkowitz, S.

Available for University of the Philippines System via ScienceDirect. Click here to access
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