Machine vision automated visual inspection : theory, practice and applications Por Beyerer, Jurgen, Puente Leon, Fernando 1969-, Frese, Christian

Available for University of the Philippines System via SpringerLink. Click here to access
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Optical inspection of sub-surface defects using digital shearography and statistical fringe analysis Por Catalan, Francesca Celine I.

Optical characterization of semiconductors infrared, raman, and photoluminescence spectroscopy Por Perkowitz, S.

Available for University of the Philippines System via ScienceDirect. Click here to access
Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy