Machine vision automated visual inspection : theory, practice and applications 著者: Beyerer, Jurgen, Puente Leon, Fernando 1969-, Frese, Christian

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Optical inspection of sub-surface defects using digital shearography and statistical fringe analysis 著者: Catalan, Francesca Celine I.

Optical characterization of semiconductors infrared, raman, and photoluminescence spectroscopy 著者: Perkowitz, S.

Available for University of the Philippines System via ScienceDirect. Click here to access
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